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Sule Ozev

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Professor
Faculty, TEMPE Campus, Mailcode 5706
Biography

Professor Sule Ozev received her doctorate from University of California San Diego's Computer Science and Engineering Department in 2002. That same year, she joined Duke University's Electrical and Computer Engineering Department as an assistant professor. She worked on testing mixed-signal and radiofrequency circuits, built-in-self test techniques, analysis and mitigation of process variations, defect-tolerant microprocessor systems, and on-line, and off-line testing of microfluidic devices. In August 2008, she joined Arizona State University's Electrical Engineering Department (now School of Electrical, Computer and Energy Engineering) as an associate professor, continuing on the same line of research. She received National Science Foundation (NSF) CAREER award in 2006, and various other awards from NSF, SRC, NASA and IBM. She has published more than 100 conference and journal papers and holds one U.S. patent.

Education
  •  Ph.D. Computer Science and Engineering, University of California-San Diego 2002
  • M.S. Computer Science and Engineering, University of California-San Diego 1998
  • B.S. Electrical Engineering, Bogazici University, Turkey 1995
Research Interests

Self-test and Self-calibration for wireless transceivers, analysis and mitigation of process variations for mixed-signal and digital circuits, fault-tolerant and reconfigurable heterogeneous systems, mixed-signal circuit testing.

Research Activity
  • Ozev,Sule*. Built-In Self-Test Techniques for Test Calibration and Trimming of Power Management Units: PMU-BIST. SEMICONDUCTOR RESEARCH CORP(5/18/2015 - 5/17/2016).
  • Bakkaloglu,Bertan*, Ozev,Sule. Online Self-Test and Reliability Monitoring of Satellite Space Power Converters. JPL(4/8/2015 - 12/30/2015).
  • Blain Christen,Jennifer Mary*, Ogras,Umit Y., Ozev,Sule. EAGER: Adaptive Performance Models of Sensing Systems for Design Space Exploration. NSF-CISE-CCF(9/1/2014 - 8/31/2016).
  • Ozev,Sule*. Built-In Self-Test Techniques for Test Calibration and Trimming of Power Management Units: PMU-BIST. UNIV OF TEXAS-DALLAS(8/1/2013 - 7/31/2016).
  • Ozev,Sule*, Bakkaloglu,Bertan, Kiaei,Sayfe. GIFT: Electrical Stimulus-Based Built-in Self Characterization for Calibration and Process Feedback of MEMS Devices. SEMICONDUCTOR RESEARCH CORP(6/24/2013 - 8/31/2015).
  • Ozev,Sule*. Defect Based Analog Circuit Diagnosis and Yield Enhancement (ASUF 30005817). ASU FDN(5/1/2013 - 4/30/2017).
  • Ozev,Sule*. Adaptive Test strategies for Minimum Energy Electronic Systems. NEW YORK UNIV(9/1/2012 - 1/31/2015).
  • Ozev,Sule*. NSF Career Writing Workshop. NSF-CISE(5/15/2012 - 4/30/2013).
  • Ozev,Sule*. Low Cost Universal Reliability System On-A-Chip for Multi-Channel Characterization. NUTREK(4/16/2012 - 1/21/2014).
  • Ozev,Sule*. XX:Small: Unified Framework for Adaptive Analog and Digital Performance Characterization Using Learned Information from the Circuit Under Test. NSF-CISE-CCF(7/1/2011 - 6/30/2016).
  • Ozev,Sule*, Bakkaloglu,Bertan, Kiaei,Sayfe. Electrical Stimulus-Based Built-in Self Characterization for Calibration and Process Feedback of MEMS Devices. SEMICONDUCTOR RESEARCH CORP(7/1/2011 - 8/31/2015).
  • Vermeire,Bert*, Bakkaloglu,Bertan, Ozev,Sule. Clock Multiplier and Serial IO Circuits for Ultra Power On-chip ADs. NUTREK(3/1/2011 - 12/31/2013).
  • Ozev,Sule*. Single Set-Up Detailed Testing of Wireless Transceiver Front-Ends Using Digital Processing. UNIV OF TEXAS-DALLAS(3/1/2011 - 5/31/2014).
  • Kiaei,Sayfe*, Bakkaloglu,Bertan, Ozev,Sule. IUCRC GOALI: Autonomous Self-Healing Sensor Network Radio and Mixed-Signal Readout system. NSF-ENG(8/1/2010 - 7/31/2014).
  • Kiaei,Sayfe*, Bakkaloglu,Bertan, Ozev,Sule. C/S: I/UCRC GOALI: Autonomous Self-Healing Sensor Network Radio and Mixed-Signal Readout system. TEXAS INSTRUMENTS(8/1/2010 - 7/31/2014).
  • Ozev,Sule*. Structural Fault Modeling, Testing, and Defect Level Estimation for Analog/RF Circuits - Year 2. UNIV OF TEXAS-DALLAS(8/1/2009 - 4/30/2011).
  • Ozev,Sule*. Characterization of RF Transceivers Using Digital Testers. SEMICONDUCTOR RESEARCH CORP(8/1/2009 - 7/31/2016).
  • Ozev,Sule*. Structural Fault Modeling, Testing, and Defect Level Estimation for Analog/RF Circuits. UNIV OF TEXAS-DALLAS(8/1/2008 - 7/31/2009).
  • Ozev,Sule*. CAREER:Hierarchical Process Variability Analysis of Analog Circuits Geared for Test and Diagnosis. NSF-CISE(8/1/2008 - 2/8/2013).
  • Ozev,Sule*. Collaborative Research:Hierarchical Testing and Yield Enhancement of High End Integrated RF Systems. NSF-CISE(8/1/2008 - 9/30/2009).
Summer 2019
Course NumberCourse Title
EEE 590Reading and Conference
EEE 592Research
EEE 595Continuing Registration
EEE 599Thesis
EEE 690Reading and Conference
EEE 790Reading and Conference
EEE 792Research
EEE 795Continuing Registration
EEE 799Dissertation
Summer 2018
Course NumberCourse Title
EEE 590Reading and Conference
EEE 592Research
EEE 595Continuing Registration
EEE 599Thesis
EEE 690Reading and Conference
EEE 790Reading and Conference
EEE 792Research
EEE 795Continuing Registration
EEE 799Dissertation
Summer 2017
Course NumberCourse Title
EEE 590Reading and Conference
EEE 592Research
EEE 595Continuing Registration
EEE 599Thesis
EEE 690Reading and Conference
EEE 790Reading and Conference
EEE 792Research
EEE 795Continuing Registration
EEE 799Dissertation
Summer 2016
Course NumberCourse Title
EEE 334Circuits II
EEE 499Individualized Instruction
EEE 590Reading and Conference
EEE 592Research
EEE 595Continuing Registration
EEE 599Thesis
EEE 690Reading and Conference
EEE 790Reading and Conference
EEE 792Research
EEE 795Continuing Registration
EEE 799Dissertation
Summer 2015
Course NumberCourse Title
EEE 493Honors Thesis
EEE 499Individualized Instruction
EEE 590Reading and Conference
EEE 592Research
EEE 595Continuing Registration
EEE 599Thesis
EEE 680Practicum
EEE 690Reading and Conference
EEE 790Reading and Conference
EEE 792Research
EEE 795Continuing Registration
EEE 799Dissertation
Honors / Awards
  • Honorable mention award, VTS (2015)
  • Best paper award,VTS (2014)
  • Honorable mention award, VTS (2013)
  • Honorable mention award, International Test Conference (2011)
  • Best student paper award, International Test Conference (2009)
  • Best paper award in European Test Symposium, 2009
  • IBM Faculty Award, 2007
  • NSF CAREER award, 2006
  • Best paper award, ICCD, 2005
  • Best Dissertation Award, University of California, San Diego, 2003
  • VLSI Test Symposium TTTC Naveena Nagi Award, 2002
  • IBM Corporation Co-operative Fellowship Award, 2000-2002
  • UCSD Flaviu Cristian Research Award, 1999-2001
Service

She served as an associate editor for IEEE Transactions on VLSI systems (2007-2014) and served on various program committees, including IEEE VLSI Test Symposium (2008-2015), IEEE International Test Conference (2007-2015), IEEE International Conference on Computer Design (2004-2015), and IEEE European Test Symposium (2006-2015). She is the program chair of the International Conference on Computer Design (2013-2015) and was the general chair for IEEE International Mixed-Signals, Sensors and Systems 2009.